INPUTS

       
Surface morphology

Charact. angle, ω o
Planar fraction  %
       
Incident illumination
Spectrum 

 
Zenith angle, θ o
       
Light trapping model

Substrate width, W  μm
           
  Layer t (nm) Optim. Material → Visit RI library
  Superstrate

Film 1

Film 2

  Substrate

         

 

OUTPUTS

     
     
Reflections Unique paths Fraction 
1 reflection  0 0.0%
2 reflections  1 68.3%
3 reflections  3 25.6%
4+ reflections  3 6.1%
Total  7 100.0%
 
       
Photon current mA/cm2 Fraction
Incident JInc 44.00 100.0%
Reflected JR 0.93 2.1%
Absorbed in films JA 0.32 0.7%
Absorbed in substrate JG 42.75 97.2%

Plot vs depth:

     

JG within specified depth:
Depth (μm)  
JG (mA/cm2) 11.32 26.54%
 
 
Download data:
Excel file
Excel file
Excel file
PC1D file
PC1D file
Quokka file
Quokka file
 
 

Computation time 0.219 s:

Link to databases: 0.000s; Determine paths: 0.000s; Prep for RAT calcs: 0.062s; RAT calculations: 0.157s; Compile graphs: 0.000s.

Comments? Bugs? Errors? Compliments?

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